------------------------------------------------------------------------------- -- TI SN74ABTH18646A -- -- IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device -- -- with 18-Bit Bus Transceivers and Registers -- -- features: bus-hold on A & B ports -- ------------------------------------------------------------------------------- -- Created by : Texas Instruments Incorporated -- -- Documentation : SN74ABTH18646A Data Sheet (SCBS166) -- -- Product Status: Released to Production (RTP) -- -- BSDL revision : 0.9 -- -- BSDL status : Preliminary -- -- Date created : 03/04/94 -- -- Last modified : 07/26/97 -- -- Modification history - -- -- - modified to update product status -- -- - misc clean-up, cosmetic only -- ------------------------------------------------------------------------------- --***************************************************************************-- --* W A R N I N G *-- --* *-- --* This BSDL file has been checked for correct syntax and semantics *-- --* using several commercial tools, but it has NOT been validated against *-- --* the device. Without validation many structural errors could be *-- --* present, leading to possible damage of the device when using its *-- --* boundary scan logic. *-- --* *-- --***************************************************************************-- ------------------------------------------------------------------------------- -- -- -- IMPORTANT NOTICE -- -- -- -- Texas Instruments (TI) reserves the right to make changes to its -- -- products or to discontinue any semiconductor product or service without -- -- notice, and advises its customers to obtain the latest version of -- -- relevant information to verify, before placing orders, that the -- -- information being relied on is current. -- -- -- -- TI warrants performance of its semiconductor products and related -- -- software to the specifications applicable at the time of sale in -- -- accordance with TI's standard warranty. Testing and other quality -- -- control techniques are utilized to the extent TI deems necessary to -- -- support this warranty. Specific testing of all parameters of each -- -- device is not necessarily performed, except those mandated by -- -- government requirements. -- -- -- -- Certain applications using semiconductor products may involve potential -- -- risks of death, personal injury, or severe property or environmental -- -- damage ("Critical Applications"). -- -- -- -- TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, INTENDED, AUTHORIZED, OR -- -- WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT APPLICATIONS, DEVICES -- -- OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. -- -- -- -- Inclusion of TI products in such applications is understood to be fully -- -- at the risk of the customer. Use of TI products in such applications -- -- requires the written approval of an appropriate TI officer. Questions -- -- concerning potential risk applications should be directed to TI through -- -- a local SC sales office. -- -- -- -- In order to minimize risks associated with the customer's applications, -- -- adequate design and operating safeguards should be provided by the -- -- customer to minimize inherent or procedural hazards. -- -- -- -- TI assumes no liability for applications assistance, customer product -- -- design, software performance, or infringement of patents or services -- -- described herein. Nor does TI warrant or represent that any license, -- -- either express or implied, is granted under any patent right, copyright, -- -- mask work right, or other intellectual property right of TI covering or -- -- relating to any combination, machine, or process in which such -- -- semiconductor products or services might be or are used. -- -- -- -- Copyright (c) 1997, Texas Instruments Incorporated -- -- -- ------------------------------------------------------------------------------- entity sn74abth18646a is generic (PHYSICAL_PIN_MAP : string := "UNDEFINED"); port (OE_NEG1:in bit; OE_NEG2:in bit; SAB1:in bit; SAB2:in bit; SBA1:in bit; SBA2:in bit; DIR1:in bit; DIR2:in bit; CLKAB1:in bit; CLKAB2:in bit; CLKBA1:in bit; CLKBA2:in bit; A1:inout bit_vector(1 to 9); A2:inout bit_vector(1 to 9); B1:inout bit_vector(1 to 9); B2:inout bit_vector(1 to 9); GND:linkage bit_vector(1 to 8); VCC:linkage bit_vector(1 to 4); NC:linkage bit_vector(1 to 4); TDO:out bit; TDI, TMS, TCK:in bit); use STD_1149_1_1990.all; -- Get standard attributes and definitions attribute PIN_MAP of sn74abth18646a : entity is PHYSICAL_PIN_MAP; constant PM : PIN_MAP_STRING := "OE_NEG1:62, OE_NEG2:21," & "SAB1:60, SAB2:22, SBA1:54, SBA2:28,"& "DIR1:53, DIR2:30, CLKAB1:59, CLKAB2:23,"& "CLKBA1:55, CLKBA2:27," & "A1:(63,64,1,2,3,5,6,7,8)," & "A2:(10,11,12,14,15,16,17,18,19)," & "B1:(51,50,49,48,47,46,44,43,42)," & "B2:(40,39,38,37,35,34,33,32,31)," & "GND:(4,13,20,29,36,45,52,61)," & "VCC:(9,25,41,57)," & "TCK:26, TDI:24, TMS:56, TDO:58 "; constant HV : PIN_MAP_STRING := "OE_NEG1:7, OE_NEG2:31," & "SAB1:5, SAB2:32, SBA1:66, SBA2:39,"& "DIR1:65, DIR2:41, CLKAB1:4, CLKAB2:33,"& "CLKBA1:67, CLKBA2:38," & "A1:(8,9,10,11,12,14,15,16,17)," & "A2:(20,21,22,24,25,26,27,28,29)," & "B1:(63,62,61,60,59,58,56,55,54)," & "B2:(51,50,49,48,46,45,44,43,42)," & "GND:(6,13,23,30,40,47,57,64)," & "VCC:(2,19,36,53)," & "NC:(1,18,35,52),"& "TCK:37, TDI:34, TMS:68, TDO:3 "; attribute TAP_SCAN_IN of TDI : signal is true; attribute TAP_SCAN_MODE of TMS : signal is true; attribute TAP_SCAN_OUT of TDO : signal is true; attribute TAP_SCAN_CLOCK of TCK : signal is (50.0e6, BOTH); attribute INSTRUCTION_LENGTH of sn74abth18646a : entity is 8; attribute INSTRUCTION_OPCODE of sn74abth18646a : entity is "BYPASS (11111111, 10000100), " & "EXTEST (00000000), " & "SAMPLE (10000010), " & "IDCODE (10000001), " & "HIGHZ (00000110), " & -- Control Boundary to High-Impedance "CLAMP (10000111), " & -- Control Boundary to 1/0 "RUNT (00001001), " & -- Boundary Run Test "READBN (00001010), " & -- Boundary Read Normal Mode "READBT (10001011), " & -- Boundary Read Test Mode "CELLTST(00001100), " & -- Boundary Self-Test Normal Mode "TOPHIP (10001101), " & -- Boundary Toggle Outputs Test Mode "SCANCN (10001110), " & -- BCR Scan Normal Mode "SCANCT (00001111) " ; -- BCR Scan Test Mode attribute INSTRUCTION_CAPTURE of sn74abth18646a : entity is "10000001"; attribute INSTRUCTION_DISABLE of sn74abth18646a : entity is "HIGHZ"; attribute INSTRUCTION_GUARD of sn74abth18646a : entity is "CLAMP"; attribute IDCODE_REGISTER of sn74abth18646a : entity is "0000" & -- 4 bit version "0000000000101001" & -- 16 bit part number "00000010111" & -- 11 bit manufacturer "1" ; -- mandatory LSB attribute REGISTER_ACCESS of sn74abth18646a : entity is "BOUNDARY (READBN, READBT, CELLTST)," & "BYPASS (HIGHZ, CLAMP, RUNT, TOPHIP)," & "IDCODE (IDCODE), " & "BCR[3] (SCANCN, SCANCT)" ; attribute BOUNDARY_CELLS of sn74abth18646a : entity is "BC_1,BC_7"; -- Cell type BC_7 must be added to the standard package (package -- STD_1149_1_1990) if it has not already been added. -- constant BC_7:CELL_INFO:= -- ((BIDIR_IN, EXTEST, PI), (BIDIR_OUT, EXTEST, PO), -- (BIDIR_IN, SAMPLE, PI), (BIDIR_OUT, SAMPLE, PI), attribute BOUNDARY_LENGTH of sn74abth18646a : entity is 52; attribute BOUNDARY_REGISTER of sn74abth18646a : entity is "0 (BC_7, B1(1) ,bidir , X, 50, 0, Z)," & "1 (BC_7, B1(2) ,bidir , X, 50, 0, Z)," & "2 (BC_7, B1(3) ,bidir , X, 50, 0, Z)," & "3 (BC_7, B1(4) ,bidir , X, 50, 0, Z)," & "4 (BC_7, B1(5) ,bidir , X, 50, 0, Z)," & "5 (BC_7, B1(6) ,bidir , X, 50, 0, Z)," & "6 (BC_7, B1(7) ,bidir , X, 50, 0, Z)," & "7 (BC_7, B1(8) ,bidir , X, 50, 0, Z)," & "8 (BC_7, B1(9) ,bidir , X, 50, 0, Z)," & "9 (BC_7, B2(1) ,bidir , X, 51, 0, Z)," & "10 (BC_7, B2(2) ,bidir , X, 51, 0, Z)," & "11 (BC_7, B2(3) ,bidir , X, 51, 0, Z)," & "12 (BC_7, B2(4) ,bidir , X, 51, 0, Z)," & "13 (BC_7, B2(5) ,bidir , X, 51, 0, Z)," & "14 (BC_7, B2(6) ,bidir , X, 51, 0, Z)," & "15 (BC_7, B2(7) ,bidir , X, 51, 0, Z)," & "16 (BC_7, B2(8) ,bidir , X, 51, 0, Z)," & "17 (BC_7, B2(9) ,bidir , X, 51, 0, Z)," & "18 (BC_7, A1(1) ,bidir , X, 48, 0, Z)," & "19 (BC_7, A1(2) ,bidir , X, 48, 0, Z)," & "20 (BC_7, A1(3) ,bidir , X, 48, 0, Z)," & "21 (BC_7, A1(4) ,bidir , X, 48, 0, Z)," & "22 (BC_7, A1(5) ,bidir , X, 48, 0, Z)," & "23 (BC_7, A1(6) ,bidir , X, 48, 0, Z)," & "24 (BC_7, A1(7) ,bidir , X, 48, 0, Z)," & "25 (BC_7, A1(8) ,bidir , X, 48, 0, Z)," & "26 (BC_7, A1(9) ,bidir , X, 48, 0, Z)," & "27 (BC_7, A2(1) ,bidir , X, 49, 0, Z)," & "28 (BC_7, A2(2) ,bidir , X, 49, 0, Z)," & "29 (BC_7, A2(3) ,bidir , X, 49, 0, Z)," & "30 (BC_7, A2(4) ,bidir , X, 49, 0, Z)," & "31 (BC_7, A2(5) ,bidir , X, 49, 0, Z)," & "32 (BC_7, A2(6) ,bidir , X, 49, 0, Z)," & "33 (BC_7, A2(7) ,bidir , X, 49, 0, Z)," & "34 (BC_7, A2(8) ,bidir , X, 49, 0, Z)," & "35 (BC_7, A2(9) ,bidir , X, 49, 0, Z)," & "36 (BC_1, SBA1 ,input , X)," & "37 (BC_1, SBA2 ,input , X)," & "38 (BC_1, SAB1 ,input , X)," & "39 (BC_1, SAB2 ,input , X)," & "40 (BC_1, CLKBA1 ,input , X)," & "41 (BC_1, CLKBA2 ,input , X)," & "42 (BC_1, CLKAB1 ,input , X)," & "43 (BC_1, CLKAB2 ,input , X)," & "44 (BC_1, OE_NEG1,input , X)," & "45 (BC_1, OE_NEG2,input , X)," & "46 (BC_1, DIR1 ,input , X)," & "47 (BC_1, DIR2 ,input , X)," & "48 (BC_1, * ,controlr, 0)," & -- 1OEA "49 (BC_1, * ,controlr, 0)," & -- 2OEA "50 (BC_1, * ,controlr, 0)," & -- 1OEB "51 (BC_1, * ,controlr, 0) " ; -- 2OEB end sn74abth18646a;