BSDL Files Library for JTAG

The only free public library that contains thousands of BSDL (Boundary Scan Description Language) models to use with BScan/JTAG tools

BSDL model: SN74BCT8374A

-------------------------------------------------------------------------------
--  TI SN74BCT8374A                                                          --
--     IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device                      --
--     with Octal D-Type Edge-Triggered Flip-Flops                           --
-------------------------------------------------------------------------------
--  Created by    : Texas Instruments Incorporated                           --
--  Documentation : SN74BCT8374A Data Sheet (SCBS045)                        --
--  Product Status: Released to Production (RTP)                             --
--  BSDL revision : 2.1                                                      --
--  BSDL status   : Production                                               --
--  Date created  : 05/01/94                                                 --
--  Last modified : 07/26/97                                                 --
--  Modification history -                                                   --
--      - misc clean-up, cosmetic only                                       --
-------------------------------------------------------------------------------
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-------------------------------------------------------------------------------

entity sn74bct8374a is

    generic (PHYSICAL_PIN_MAP : string := "UNDEFINED");

    port (CLK:in bit;
          Q:out bit_vector(1 to 8);
          D:in bit_vector(1 to 8);
          GND, VCC:linkage bit;
          OE_NEG:in bit;
          TDO:out bit;
          TMS, TDI, TCK:in bit;
          NC:linkage bit_vector(1 to 4));

    use STD_1149_1_1990.all; -- Get Standard attributes and definitions

    attribute PIN_MAP of sn74bct8374a : entity is PHYSICAL_PIN_MAP;

    constant JT : PIN_MAP_STRING := "CLK:1, Q:(2,3,4,5,7,8,9, " &
                                    "10), D:(23,22,21,20,19, " &
                                    "17,16,15), GND:6, VCC:18, " &
                                    "OE_NEG:24, TDO:11, TMS:12, " &
                                    "TCK:13, TDI:14";

    constant DW : PIN_MAP_STRING := "CLK:1, Q:(2,3,4,5,7,8,9, " &
                                    "10), D:(23,22,21,20,19, " &
                                    "17,16,15), GND:6, VCC:18,"  &
                                    "OE_NEG:24, TDO:11, TMS:12, " &
                                    "TCK:13, TDI:14";

    constant NT : PIN_MAP_STRING := "CLK:1, Q:(2,3,4,5,7,8,9, " &
                                    "10), D:(23,22,21,20,19, " &
                                    "17,16,15), GND:6, VCC:18, " &
                                    "OE_NEG:24, TDO:11, TMS:12, " &
                                    "TCK:13, TDI:14";

    constant FK : PIN_MAP_STRING := "CLK:9, Q:(10,11,12,13,16,17," &
                                    "18,19), D:(6,5,4,3,2,27,26,25), " &
                                    "GND:14, VCC:28, OE_NEG:7, " &
                                    "TDO:20, TMS:21, TCK:23, TDI:24," &
                                    "NC:(1,8,15,22)";

    attribute TAP_SCAN_IN    of TDI : signal is true;
    attribute TAP_SCAN_MODE  of TMS : signal is true;
    attribute TAP_SCAN_OUT   of TDO : signal is true;
    attribute TAP_SCAN_CLOCK of TCK : signal is (20.0e6, BOTH);

    attribute INSTRUCTION_LENGTH of sn74bct8374a : entity is 8;
    attribute INSTRUCTION_OPCODE of sn74bct8374a : entity is
            "BYPASS (11111111, 10001000, 00000101, 10000100, 00000001), " &
            "EXTEST (00000000, 10000000),"  &
            "SAMPLE (00000010, 10000010),"  &
            "INTEST (00000011, 10000011),"  &
            "HIGHZ  (00000110, 10000110),"  & -- Bypass with outputs high-z
            "CLAMP  (00000111, 10000111),"  & -- Bypass with bs values
            "RUNT   (00001001, 10001001),"  & -- Boundary run test
            "READBN (00001010, 10001010),"  & -- Boundary read normal mode
            "READBT (00001011, 10001011),"  & -- Boundary read test mode
            "CELLTST(00001100, 10001100),"  & -- Boundary selftest normal
            "TOPHIP (00001101, 10001101),"  & -- Boundary toggle out test
            "SCANCN (00001110, 10001110),"  & -- BCR scan normal
            "SCANCT (00001111, 10001111)"   ; -- BCR scan test

    attribute INSTRUCTION_CAPTURE of sn74bct8374a : entity is "10000001";
    attribute INSTRUCTION_DISABLE of sn74bct8374a : entity is "HIGHZ";
    attribute INSTRUCTION_GUARD   of sn74bct8374a : entity is "CLAMP";

    attribute REGISTER_ACCESS of sn74bct8374a : entity is
            "BOUNDARY (EXTEST, SAMPLE, INTEST, READBN, READBT, CELLTST)," &
            "BYPASS   (BYPASS, HIGHZ, CLAMP, RUNT, TOPHIP)," &
            "BCR[2]   (SCANCN, SCANCT)" ;

    attribute BOUNDARY_CELLS    of sn74bct8374a : entity is "BC_1";
    attribute BOUNDARY_LENGTH   of sn74bct8374a : entity is 18;
    attribute BOUNDARY_REGISTER of sn74bct8374a : entity is
    " 0 (BC_1, Q(8)  ,output3, X, 16, 1, Z), "  &
    " 1 (BC_1, Q(7)  ,output3, X, 16, 1, Z), "  &
    " 2 (BC_1, Q(6)  ,output3, X, 16, 1, Z), "  &
    " 3 (BC_1, Q(5)  ,output3, X, 16, 1, Z), "  &
    " 4 (BC_1, Q(4)  ,output3, X, 16, 1, Z), "  &
    " 5 (BC_1, Q(3)  ,output3, X, 16, 1, Z), "  &
    " 6 (BC_1, Q(2)  ,output3, X, 16, 1, Z), "  &
    " 7 (BC_1, Q(1)  ,output3, X, 16, 1, Z), "  &
    " 8 (BC_1, D(8)  ,input  , X), " &
    " 9 (BC_1, D(7)  ,input  , X), " &
    "10 (BC_1, D(6)  ,input  , X), " &
    "11 (BC_1, D(5)  ,input  , X), " &
    "12 (BC_1, D(4)  ,input  , X), " &
    "13 (BC_1, D(3)  ,input  , X), " &
    "14 (BC_1, D(2)  ,input  , X), " &
    "15 (BC_1, D(1)  ,input  , X), " &
    "16 (BC_1, OE_NEG,input  , X), " & -- merged Input/Control cell
    "16 (BC_1, *     ,control, 1), " & -- merged input/control cell
    "17 (BC_1, CLK   ,input  , X)  " ;

end sn74bct8374a;